IXBF55N300
ISOPLUS i4-PakTM (HV) Outline
Symbol Test Conditions
(TJ = 25°C Unless Otherwise Specified)
Characteristic Values
Min.
Typ.
Max.
gfS
IC = 55A, VCE = 10V, Note 1
VCE = 25V, VGE = 0V, f = 1MHz
32
50
S
Cies
Coes
Cres
7300
275
83
pF
pF
pF
Qg
335
47
nC
nC
nC
Qge
Qgc
IC = 55A, VGE = 15V, VCE = 1000V
130
td(on)
tr
td(off)
tf
td(on)
tr
td(off)
tf
54
307
230
268
ns
ns
ns
ns
Resistive Switching Times, TJ = 25°C
Pin 1 = Gate
IC = 110A, VGE = 15V
Pin2 = Emitter
Pin 3 = Collector
Tab 4 = Isolated
VCE = 1250V, RG = 2Ω
52
585
215
260
ns
ns
ns
ns
Resistive Switching Times, TJ = 125°C
IC = 110A, VGE = 15V
VCE = 1250V, RG = 2Ω
RthJC
RthCS
0.35 °C/W
°C/W
0.15
Reverse Diode
Symbol Test Conditions
Characteristic Values
(TJ = 25°C Unless Otherwise Specified)
Min.
Typ.
Max
VF
trr
IF = 55A, VGE = 0V, Note 1
IF = 28A, VGE = 0V, -diF/dt = 100A/μs
VR = 100V, VGE = 0V
2.5
V
μs
A
1.9
54
IRM
Notes:
1. Pulse test, t < 300μs, duty cycle, d < 2%.
2. Device must be heatsunk for high-temperature leakage current
measurements to avoid thermal runaway.
IXYS Reserves the Right to Change Limits, Test Conditions and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537