IXA55I1200HJ
preliminary
Ratings
IGBT
Symbol
VCES
Definition
collector emitter voltage
Conditions
min. typ. max. Unit
TVJ
=
25°C
1200
±20
±30
84
V
V
V
A
A
W
V
V
V
max. DC gate voltage
VGES
VGEM
IC25
max. transient gate emitter voltage
collector current
TC = 25°C
TC = 80°C
TC = 25°C
TVJ = 25°C
TVJ = 125°C
TVJ = 25°C
TVJ = 25°C
TVJ = 125°C
IC
54
80
total power dissipation
P
tot
290
2.1
collector emitter saturation voltage
VCE(sat)
IC = 50A; V = 15 V
1.8
2.1
6.0
GE
gate emitter threshold voltage
collector emitter leakage current
VGE(th)
ICES
IC = 2mA; VGE = VCE
5.5
6.5
VCE = VCES; V = 0 V
0.1 mA
mA
GE
0.1
gate emitter leakage current
total gate charge
IGES
VGE = ±20 V
500
nA
nC
ns
QG(on)
td(on)
tr
VCE = 600 V; V = 15 V; IC = 50 A
190
70
GE
turn-on delay time
current rise time
40
ns
inductive load
VCE 600V; IC = 50A
TVJ = 125°C
turn-off delay time
td(off)
t f
250
100
4.5
5.5
ns
=
current fall time
ns
VGE = ±15 V; RG= 15 Ω
turn-on energy per pulse
turn-off energy per pulse
reverse bias safe operating area
Eon
mJ
mJ
Eoff
RBSOA
ICM
VGE = ±15 V; RG= 15 Ω
VCEmax = 1200V
TVJ = 125°C
TVJ = 125°C
A
150
10
short circuit safe operating area
short circuit duration
SCSOA
tSC
VCEmax = 900V
VCE = 900V; VGE = ±15 V
RG = 15Ω; non-repetitive
µs
A
short circuit current
ISC
200
thermal resistance junction to case
thermal resistance case to heatsink
RthJC
RthCH
0.43 K/W
K/W
0.25
Diode
VRRM
IF25
max. repetitive reverse voltage
forward current
TVJ = 25°C
TC = 25°C
TC = 80°C
TVJ = 25°C
TVJ = 125°C
TVJ = 25°C
TVJ = 125°C
1200
tbd
V
A
IF80
tbd
A
forward voltage
VF
IF =
A
tbd
V
tbd
V
reverse current
IR
VR = VRRM
*
mA
mA
µC
A
* not applicable, see Ices value above
reverse recovery charge
*
tbd
tbd
tbd
tbd
Qrr
VR = 600 V
-diF /dt =
max. reverse recovery current
reverse recovery time
IRM
A/µs
TVJ = 125°C
trr
ns
mJ
IF =
A; V = 0 V
GE
reverse recovery energy
Erec
RthJC
RthCH
thermal resistance junction to case
thermal resistance case to heatsink
tbd K/W
K/W
IXYS reserves the right to change limits, conditions and dimensions.
Data according to IEC 60747and per semiconductor unless otherwise specified
20090409
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