IXTA26P20P IXTP26P20P
IXTQ26P20P IXTH26P20P
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = -10V, ID = 0.5 • ID25, Note 1
VGS = 0V, VDS = -25V, f = 1MHz
10
17
S
Ciss
Coss
Crss
2740
540
pF
pF
pF
100
td(on)
tr
td(off)
tf
18
33
46
21
ns
ns
ns
ns
Resistive Switching Times
VGS = -10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
RG = 3.3Ω (External)
Qg(on)
Qgs
56
18
20
nC
nC
nC
VGS = -10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
Qgd
RthJC
RthCS
0.42 °C/W
°C/W
(TO-3P & TO-247)
(TO-220)
0.21
0.50
°C/W
Safe Operating Area Specification
Symbol
SOA
Test Conditions
Characteristic Values
Min. Typ. Max.
VDS = - 200V, ID = - 0.8A, TC = 70°C, Tp = 5s 160
W
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
IS
VGS = 0V
- 26
A
A
V
ISM
VSD
Repetitive, Pulse Width Limited by TJM
IF = -13A, VGS = 0V, Note 1
- 104
- 3.2
trr
QRM
IRM
240
2.2
-18.0
ns
μC
A
IF = -13A, -di/dt = -100A/μs
VR = -100V, VGS = 0V
Note 1. Pulse Test, t ≤ 300μs; Duty Cycle, d ≤ 2%.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537