IXTY08N100D2 IXTA08N100D2
IXTP08N100D2
Symbol
Test Conditions
Characteristic Values
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = 30V, ID = 400mA, Note 1
VGS = -10V, VDS = 25V, f = 1MHz
330
560
mS
Ciss
Coss
Crss
325
24
pF
pF
pF
6.5
td(on)
tr
td(off)
tf
28
57
34
48
ns
ns
ns
ns
Resistive Switching Times
VGS = 5V, VDS = 500V, ID = 400mA
RG = 10 (External)
Qg(on)
Qgs
14.6
1.2
nC
nC
nC
VGS = 5V, VDS = 500V, ID = 400mA
Qgd
8.3
RthJC
RthCS
2.08C/W
C/W
TO-220
0.50
Safe-Operating-Area Specification
Characteristic Values
Symbol
SOA
Test Conditions
Min.
Typ.
Max.
VDS = 800V, ID = 45mA, TC = 75C, Tp = 5s
36
W
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max.
VSD
IF = 800mA, VGS = -10V, Note 1
0.8
1.3
V
trr
IRM
QRM
1.03
7.40
3.80
μs
A
μC
IF = 800mA, -di/dt = 100A/s
VR = 100V, VGS = -10V
Note 1. Pulse test, t 300s, duty cycle, d 2%.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537