IXTN60N50L2
Symbol
Test Conditions
Characteristic Values
SOT-227B (IXTN) Outline
(TJ = 25°C, unless otherwise specified)
Min.
Typ.
Max.
gfs
VDS = 10V, ID = 30A, Note 1
VGS = 0V, VDS = 25V, f = 1MHz
18
25
32
S
Ciss
Coss
Crss
24
1325
172
nF
pF
pF
td(on)
tr
td(off)
tf
40
40
ns
ns
ns
ns
Resistive Switching Times
V
GS = 15V, VDS = 0.5 • VDSS, ID = 30A
165
38
RG = 0.5Ω (External)
Qg(on)
Qgs
610
130
365
nC
nC
nC
(M4 screws (4x) supplied)
VGS = 10V, VDS = 0.5 • VDSS, ID = 30A
Qgd
RthJC
RthCS
0.17 °C/W
°C/W
0.05
Safe Operating Area Specification
Symbol
SOA
Test Conditions
Min.
Typ.
Max.
VDS = 400V, ID = 0.9A, TC = 75°C, tp = 3s
360
W
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min. Typ.
Max.
IS
VGS = 0V
60
A
A
V
ISM
VSD
Repetitive, pulse width limited by TJM
IF = IS, VGS = 0V, Note 1
240
1.5
trr
IRM
980
73
ns
A
IF = 60A, -di/dt = 100A/μs
VR = 100V, VGS = 0V
QRM
35.8
μC
Note 1: Pulse test, t ≤ 300μs; duty cycle, d ≤ 2%.
PRELIMINARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are derived
from data gathered during objective characterizations of preliminary engineering lots; but also may yet
contain some information supplied during a pre-production design evaluation. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537