IXSH 30N60B2D1
IXST 30N60B2D1
Symbol
gfs
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
TO-247 (IXSH) Outline
min. typ.
7.0 12.0
1220
max.
IC = 24A; VCE = 10 V, Note 1
S
1
2
3
Cies
pF
Coes
VCE = 25 V, VGE = 0 V
f = 1 MHz
110
140
pF
pF
20N60B2D1
Cres
42
pF
Qg
50
23
15
nC
nC
nC
Terminals: 1 - Gate
2 - Drain
Qge
Qgc
IC = 24A, VGE = 15 V, VCE = 0.5 VCES
Dim.
Millimeter
Inches
Min. Max.
Min. Max.
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
Inductive load, TJ = 25°C
td(on)
tri
td(off)
tfi
30
30
ns
ns
IC = 24A, VGE = 15 V
VCE = 400 V, RG = 5 Ω
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
130
140
0.55
280 ns
300 ns
1.0 mJ
Switching times may increase for VCE
(Clamp) > 0.8 • VCES, higher TJ or
increased RG
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
Eoff
20.80 21.46
15.75 16.26
e
L
L1
5.20
19.81 20.32
4.50
5.72 0.205 0.225
td(on)
tri
30
50
ns
ns
.780 .800
.177
Inductive load, TJ = 125°C
∅P 3.55
5.89
3.65
.140 .144
IC = 24 A, VGE = 15 V
Eon
20N60B2 0.32
20N60B2D1 0.82
mJ
mJ
Q
6.40 0.232 0.252
V
CE = 400 V, RG = 5 Ω
Switching times may increase for
VCE (Clamp) > 0.8 • VCES, higher TJ
or increased RG
td(off)
tfi
202
234
1.18
ns
ns
TO-268 (IXST) Outline
Eoff
mJ
RthJC
RthCS
0.50 K/W
K/W
0.21
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
VF
TestConditions
IF = 30A, VGE = 0 V
TJ =150°C
1.6
2.5
2.5
V
V
A
IRM
trr
IF = 50A, VGE = 0 V, -diF/dt = 100 A/µs
VR = 100 V
TJ = 100°C 2.0
TJ = 100°C 150
ns
trr
IF = 1 A; -di/dt = 100 A/µs; VR = 30 V
30
ns
RthJC
0.9 K/W
Note 1: Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
IXYSMOSFETs andIGBTsarecovered by
oneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123B1
6,306,728 B1
6,404,065B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692