IXGR 50N60B
IXGR 50N60BD1
Symbol
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
ISOPLUS247OUTLINE
gfs
IC = I ; V = 10 V,
25
35
S
PulseTtesCt,E t ≤ 300 µs, duty cycle ≤ 2 %
Cies
4100
pF
pF
pF
Coes
Cres
VCE = 25 V, VGE = 0 V, f = 1 MHz
300
50
pF
Qg
110
30
nC
nC
nC
Qge
Qgc
IC = IT, VGE = 15 V, VCE = 0.5 VCES
35
1 Gate, 2 Drain (Collector)
3 Source (Emitter)
td(on)
tri
td(off)
tfi
50
50
ns
ns
ns
ns
Inductive load, TJ = 25°C
4 no connection
IC = I , V = 15 V, L = 100uH
VCE =T0.8G•EVCES, RG = Roff = 2.7 Ω
Dim.
Millimeter
Inches
110 270
85 150
Min.
Max. Min. Max.
Remarks: Switching times may
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
A
4.83
2.29
1.91
1.14
1.91
2.92
5.21
2.54
2.16
.190 .205
.090 .100
.075 .085
A
,
A12
Eoff
3.0
4.0
mJ
b
1.40
2.13
3.12
.045 .055
.075 .084
.115 .123
b
b12
Inductive load, TJ = 125°C
td(on)
tri
50
60
ns
ns
mJ
ns
ns
C
D
E
0.61
0.80
.024 .031
.819 .840
.620 .635
IC = IT, VGE = 15 V, L = 100uH
VCE = 0.8 • VCES, RG = Roff = 2.7 Ω
20.80 21.34
15.75 16.13
Eon
td(off)
tfi
3
e
5.45 BSC
.215 BSC
.780 .800
.150 .170
Remarks: Switching times may
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
200
250
L
19.81 20.32
,
L1
3.81
4.32
Q
5.59
6.20
.220 .244
R
4.32
4.83
.170 .190
Eoff
4.2
mJ
RthJC
RthCK
0.5 K/W
K/W
0.15
ReverseDiode(FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol
VF
TestConditions
min. typ. max.
IF = I , VGE = 0 V,
T = 150°C
1.6
2.5
V
V
PulseTtest, t ≤ 300 ms, duty cycJle ≤ 2 %
IRM
IF = IT, V = 0 V, -diF/dt = 100 A/ms,TJ = 100°C 3.2
A
ns
ns
VR = 100 GVE
trr
IF = 1 A; -di/dt = 200 A/ms; VR = 30 V
35
RthJC
0.85 K/W
Note: IT,= 50A
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered by
oneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
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5,237,481
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6,162,665
6,259,123B1
6,306,728 B1
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6,710,405B2
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