8XC196MC
3. EXTINT function description now includes
WG PROTECT (1FCEH) as the name and ad-
87C196MC DESIGN
CONSIDERATIONS
Ð
dress of the register used to select positive/neg-
ative or high/low detection for EXTINT.
When an indirect shift during divide occurs the upper
3 bits of the shift count are not masked completely.
If the shift count register has the value 32 n where n
e
1, 3, 5 or 7, the operand will be shifted 32 times.
This should have resulted in no shift taking place.
4. The memory range 01F00H–01FBFH was added
to the SFR map as RESERVED.
*
b
b
5. I changed from 60 mA to 70 mA.
IL
6. I
changed from 5 mA to 2 mA maximum and
the typical specification was removed.
REF
7. The READY description of the READY TIMINGS
(One Wait State) graphic was modified to denote
the shifting of the leading edge of READY versus
frequency. At 16 MHz the falling edge of READY
occurs before the falling edge of ALE.
DATA SHEET REVISION HISTORY
This data sheet (270946-004) is valid for devices
with a ‘‘B’’ at the end of the topside tracking number.
Data sheets are changed as new device information
becomes available. Verify with your local Intel sales
office that you have the latest version before finaliz-
ing a design or ordering devices.
8. AC Testing Input, Output Waveform was
changed to reflect inputs driven at 3.5V for a
Logic ‘‘1’’ and .45V for a Logic ‘‘0’’ and timing
measurements made at 2.0V for a Logic ‘‘1’’
and 0.8V for a Logic ‘‘0’’.
The following important differences exist between
this data sheet (270946-002) and the previous ver-
sion (270946-003):
e
9. Float Waveform was changed from I /I
s
OL OH
g
g
15 mA
15 mA to I /I
OL OH
1. The data sheet was reorganized to standard for-
mat.
10. AD TIME register for 10-bit conversions was
Ð
changed from 0C7H to 0D8H. The number of
sample time states was changed from 24 to 25
states, the conversion time states was changed
from 80 to 240 states, and the total conversion
2. Added 83C196MC device.
3. Added package thermal characteristics.
4. Added note on missing pins on SDIP package.
5. Removed SFR maps (now in user’s manual).
e
conversion time for AD TIME
time for AD TIME
Ð
D8H replaced the total
e
C7H.
Ð
11. The number of sample time states for an 8-bit
conversion was changed from 20 states to 21
states.
6. Added note on T
and T
specifications.
LLGV
LLYV
7. Changed 10-bit mode T
from 15.0 ms.
(MIN) to 10.0 ms
CONV
12. There is a single entry in the ERRATA section of
this version of the data sheet concerning the
results of an indirect shift during divide.
8. Changed 10-bit mode T
from 18.0 ms.
(MAX) to 20.0 ms
CONV
9. Changed VREF (MIN) in 8- and 10-bit mode to
4.0V from 4.5V.
The following important differences exist between
this data sheet (270946-002) and the previous ver-
sion (270946-001):
The following important differences exist between
data sheet 270946-003 and the previous version
(270946-002):
1. T
Ambient Temperature Under Bias Min
b
A
changed from 20 C to 40 C.
b
§
§
A/D Conversion Reference Current Max
1. The data sheet title was changed to better reflect
the purpose of the 87C196MC as an AC Inverter/
DC Brushless Motor Control Microcontroller.
2. I
REF
changed from 5 mA to 2 mA.
3. Testing levels changed from TTL values to
CMOS values.
2. The standard temperature range for this part now
b
a
covers 40 C to 85 C.
§
§
4. A/D Input Series Resistance Max changed from
1.2 KX to 2 KX.
22