IXGR 60N60C2
IXGR 60N60C2D1
Symbol
gfs
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min. Typ. Max.
ISOPLUS 247 Outline
IC = 50 A; VCE = 10 V,
Note 1
40
55
S
Cies
3900
280
320
97
pF
pF
pF
pF
Coes
VCE= 25 V, VGE = 0 V, f = 1 MHz
60N60C2
60N60C2D1
Cres
Qg
140
28
35
nC
nC
nC
Qge
Qgc
IC = 50 A, VGE = 15 V, VCE = 0.5 VCES
Inductive load, TJ = 25°C
IC = 50 A, VGE = 15 V
VCE = 400 V, RG = Roff = 2.0 Ω
td(on)
tri
td(off)
tfi
18
25
ns
ns
95 150 ns
35 ns
0.49 0.8 mJ
Eoff
td(on)
tri
18
25
1.6
130
80
ns
ns
mJ
ns
Inductive load, TJ = 125°C
IC = 50 A, VGE = 15 V
VCE = 400 V, RG = Roff = 2.0 Ω
Eon
td(off)
tfi
ns
Eoff
0.92
mJ
RthJ-DCB
RthJC
(Note 2)
(Note 3)
0.25
K/W
0.50 K/W
K/W
RthCS
0.15
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
VF
TestConditions
IF = 60 A, VGE = 0 V,
Note 1
2.0
V
A
TJ = 150°C
1.39
IRM
IF = 60 A, V = 0 V, -diF/dt = 100 A/µ TJ = 100°C
VR = 100 VGE
IF = 1 A; -di/dt = 200 A/ms; VR = 30 V
8.3
trr
35
ns
0.85 K/W
RthJC
Note 1: Pulse test, t ≤ 300 µs, duty cycle ≤ 2 %
2: RthJ-DCB is the thermal resistance junction-to-internal side of DCB substrate
3: RthJC is the thermal resistance junction-to-external side of DCB substrate
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered byoneormore
ofthefollowingU.S.patents:
4,850,072
4,835,592
4,931,844
4,881,106
5,034,796
5,017,508
5,063,307
5,049,961
5,237,481
5,187,117
5,381,025
5,486,715
6,404,065B1 6,162,665
6,534,343
6,583,505
6,306,728B1 6,259,123B1 6,306,728B1 6,683,344