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4PTxxAT03

型号:

4PTxxAT03

品牌:

NELLSEMI[ NELL SEMICONDUCTOR CO., LTD ]

页数:

7 页

PDF大小:

475 K

RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
Sensitive gate SCRs, 4A  
Main Features  
2
2
Symbol  
Value  
Unit  
IT(RMS)  
A
4
2
1
1
3
2
VDRM/VRRM  
IGT  
V
600 to 800  
10 to 200  
3
TO-251 (I-PAK)  
TO-252 (D-PAK)  
µA  
(4PTxxF)  
(4PTxxG)  
2
DESCRIPTION  
Thanks to highly sensitive triggering levels, the 4PT  
series is suitable for all applications where the  
available gate current is limited, such as motor  
control for hand tools, kitchen aids, capacitive  
discharge ignitions, overvoltage crowbar protection  
for low power supplies among others.  
1
2
3
1
2
3
TO-220AB (Non-lnsulated)  
TO-220AB (lnsulated)  
(4PTxxAI)  
(4PTxxA)  
Available in through-hole or surface-mount packages,  
they provide an optimized performance in a limited  
space area.  
1
2
3
1
2
3
TO-202-3  
(4PTxxAT)  
2(A)  
TO-126 (Non-lnsulated)  
(4PTxxAM)  
3(G)  
1(K)  
ABSOLUTE MAXIMUM RATINGS  
TEST CONDITIONS  
VALUE  
UNIT  
PARAMETER  
SYMBOL  
Tc=115°C  
TO-251/TO-252/TO-220AB  
TO-220AB insulated  
TO-126  
Tc=110°C  
Tc=95°C  
Tc=60°C  
Tc=115°C  
Tc=110°C  
Tc=95°C  
Tc=60°C  
t = 20 ms  
t = 16.7 ms  
RMS on-state current full sine wave  
(180° conduction angle )  
IT(RMS)  
4
A
A
TO-202-3  
TO-251/TO-252/TO-220AB  
TO-220AB insulated  
TO-126  
Average on-state current  
(180° conduction angle)  
IT(AV)  
2.5  
TO-202-3  
F =50 Hz  
30  
33  
Non repetitive surge peak on-state  
ITSM  
A
current (full cycle, T initial = 25°C)  
j
F =60 Hz  
I2t Value for fusing  
I2t  
A2s  
A/µs  
tp = 10 ms  
4.5  
Critical rate of rise of on-state current  
IG = 2xlGT, tr≤100ns  
F = 60 Hz  
dI/dt  
Tj = 125ºC  
Tj = 125ºC  
50  
IGM  
PG(AV)  
VDRM  
VRRM  
Tstg  
Peak gate current  
Tp = 20 µs  
Tj =125ºC  
1.2  
0.2  
A
Average gate power dissipation  
Repetitive peak off-state voltage  
W
600 and 800  
V
Tj =125ºC  
Repetitive peak reverse voltage  
Storage temperature range  
- 40 to + 150  
- 40 to + 125  
ºC  
Tj  
Operating junction temperature range  
Page 1 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
ELECTRICAL SPECIFICATIONS (TJ = 25 ºC unless otherwise specified)  
4PTxxxx  
SYMBOL  
Unit  
TEST CONDITIONS  
Min.  
Max.  
10  
IGT  
µA  
VD = 12V, RL = 30Ω  
200  
0.8  
0.1  
5
VGT  
VGD  
IH  
Max.  
Min.  
Max.  
Min.  
Min.  
Max.  
Max.  
Max.  
V
V
VD = VDRM, RL = 3.3KΩ, RGK = 220Ω, Tj = 125°C  
IT = 50mA, RGK = 1KΩ  
mA  
mA  
V/µs  
IL  
IG = 1mA, RGK = 1KΩ  
6
VD = 67% VDRM RGK = 1KΩ, Tj = 125°C  
,
IT = 8A, tP = 380 µs  
dV/dt  
10  
1.6  
5
Tj = 25°C  
Tj = 25°C  
Tj = 125°C  
VTM  
V
µA  
IDRM  
IRRM  
VD=VDRM, VR=VRRM  
RGK=1K  
1
mA  
THERMAL RESISTANCE  
SYMBOL  
Parameter  
VALUE  
UNIT  
Rth(j-c)  
Junction to case (DC)  
IPAK/DPAK/TO-220AB/TO-126  
TO-252(D-PAK)  
2.8  
70  
S = 0.5 cm2  
TO-220AB  
60  
°C/W  
Rth(j-a)  
Junction to ambient  
Junction to lead (DC)  
TO-251(I-PAK)/TO-126  
100  
15  
Rth(j-l)  
TO-202-3  
PRODUCT SELECTOR  
VOLTAGE (xx)  
PART NUMBER  
SENSITIVITY  
PACKAGE  
600 V  
V
800 V  
70~200 µA  
10~30 µA  
20~30 µA  
30~60 µA  
50~80 µA  
70~200 µA  
10~30 µA  
20~30 µA  
30~60 µA  
50~80 µA  
70~200 µA  
10~30 µA  
20~30 µA  
30~60 µA  
50~80 µA  
70~200 µA  
10~30 µA  
20~30 µA  
30~60 µA  
50~80 µA  
10~30 µA  
30~60 µA  
50~80 µA  
4PTxxA-S/4PTxxAl-S  
4PTxxA-03/4PTxxAl-03  
4PTxxA-05/4PTxxAl-05  
4PTxxA-06/4PTxxAl-06  
4PTxxA-08/4PTxxAl-08  
4PTxxF-S  
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
TO-220AB  
TO-220AB  
TO-220AB  
TO-220AB  
TO-220AB  
I-PAK  
V
V
V
V
V
4PTxxF-03  
V
I-PAK  
4PTxxF-05  
V
I-PAK  
4PTxxF-06  
V
I-PAK  
4PTxxF-08  
V
I-PAK  
4PTxxG-S  
V
D-PAK  
4PTxxG-03  
V
D-PAK  
4PTxxG-05  
V
D-PAK  
4PTxxG-06  
V
D-PAK  
4PTxxG-08  
V
D-PAK  
4PTxxAM-S  
V
TO-126  
TO-126  
TO-126  
TO-126  
TO-126  
TO-202-3  
TO-202-3  
TO-202-3  
4PTxxAM-03  
V
4PTxxAM-05  
V
4PTxxAM-06  
V
4PTxxAM-08  
V
4PTxxAT-03  
V
4PTxxAT-06  
V
4PTxxAT-08  
V
Page 2 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
ORDERING INFORMATION  
,
PACKAGE  
WEIGHT  
2.0g  
DELIVERY MODE  
ORDERING TYPE  
MARKING  
BASE Q TY  
4PTxxA-yy  
4PTxxA-yy  
4PTxxAI-yy  
TO-220AB  
50  
50  
Tube  
Tube  
TO-220AB (insulated)  
4PTxxAI-yy  
2.3g  
4PTxxF-yy  
4PTxxG-yy  
4PTxxF-yy  
4PTxxG-yy  
0.40g  
0.38g  
TO-251(I-PAK)  
TO-252(D-PAK)  
80  
80  
Tube  
Tube  
TO-126  
4PTxxAM-yy  
4PTxxAT-yy  
4PTxxAM-yy  
4PTxxAT-yy  
0.75g  
g
500  
500  
Bag  
Bag  
TO-202-3  
Note: xx = voltage, yy = sensitivity  
ORDERING INFORMATION SCHEME  
-
S
4 PT 06  
Current  
4 = 4A, IT(RMS)  
SCR series  
Voltage Code  
06 = 600V  
08 = 800V  
Package type  
A = TO-220AB (non-insulated)  
AI = TO-220AB ( insulated)  
F = TO-251 (I-PAK)  
G = TO-252 (D-PAK)  
AM = TO-126  
AT = TO-202-3  
IGT Sensitivity  
03 = 10~30 µA  
05 = 20~50 µA  
06 = 30~60 µA  
08 = 50~80 µA  
S = 70~200 µA  
Page 3 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
Fig.1 Maximum average power dissipation versus  
Fig.2 Average and DC on-state current versus  
case temperature  
on-state current  
IT(AV)(A)  
P(W)  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
4.0  
3.5  
α=180°  
DC  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
TO-126  
α=180°  
TO-220AB  
Insulated  
TO-202-3  
360°  
TO-251/ TO-252  
TO-220AB  
1.0  
0.5  
0.0  
α
T
(°C)  
case  
IT(AV)(A)  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
0
25  
50  
75  
100  
125  
Fig.4 Relative variation of thermal impedance  
Fig.3 Average and DC on-state current versus  
junction to ambient versus pulse duration  
(DPAK)  
ambient temperature (DPAK)  
IT(AV)(A)  
K=[Zth(j-c)/Rth(j-c)  
]
1E+0  
1E-1  
2.0  
Device mounted on FR4 with  
recommended pad layout  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
Z
th(j-c)  
DPAK (S = 0.5cm²)  
DC  
α=180°  
Z
th(j-a)  
IPAK  
DC  
1E-2  
1E-3  
α=180°  
Device mounted on FR4 with  
recommended pad layout  
0.2  
0.0  
tp(s)  
1E+0  
T
(°C)  
amb  
0
25  
50  
75  
100  
125  
1E-3  
1E-2  
1E-1  
1E+1  
1E+2  
5E+2  
Fig.5 Relative variation of gate trigger current  
and holding current versus junction  
temperature  
Fig.6 Relative variation of holding current  
versus gate-cathode resistance  
(typical values)  
IH[RGK] / IH[RGK=1KΩ]  
IGT,IH,IL[Tj] / IGT,IH,IL[Tj=25°C]  
5
4
2.0  
Tj=25°C  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
IGT  
l
IL  
3
2
hand  
R
=1KΩ  
GK  
0.4  
T (°C)  
j
1
0
0.2  
0.0  
-40 -20  
RGK(KΩ)  
0
20  
40  
60  
80  
100 120 140  
1E-2  
1E-1  
1E+0  
1E+1  
Page 4 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
Fig.7 Relative variation of dV/dt immunity  
versus gate-cathode resistance  
(typical values)  
Fig.8 Relative variation of dV/dt immunity  
versus gate-cathode capacitance  
(typical values)  
dV/dt[RGK] / dV/dt[RGK=220Ω]  
dV/dt[CGK] / dV/dt[RGK=220Ω]  
10.00  
1.00  
0.10  
0.01  
10  
8
Tj=125°C  
VD=0.67 X VDRM  
VD=0.67 X VDRM  
Tj=125°C  
RGK=220Ω  
6
4
2
RGK(KΩ)  
C
(nF)  
GK  
0
0
200 400 600 800 1000 1200 1400 1600 1800 2000  
0
2
4
6
8
10 12 14 16 18 20 22  
Fig.9 Surge peak on-state current versus  
number of ctcles  
Fig.10 Non-repetitive surge peak on-state  
current, and corresponding values  
of l²t  
ITSM(A)  
ITSM(A),I²t(A²s)  
300  
100  
35  
30  
25  
20  
15  
10  
5
Tj inital=25 °C  
dI/dt Iimitation  
tp=10ms  
One cycle  
ITSM  
Non repetitive  
Tj inital=25°C  
10  
1
Repetitive  
Tc=115°C  
I²t  
Sinusoi dal pul se with  
width < 10ms  
t (ms)  
p
Number of cycles  
0
1
10  
100  
1000  
0.01  
0.10  
1.00  
10.00  
Fig.11 On-state characteristics (maximum  
values)  
Fig.12 Thermal resistance junction to ambient  
versus copper surface under tab (DPAK)  
ITM(A)  
Rth(j-a)(°C/W)  
100  
80  
60  
40  
20  
0
50.0  
10.0  
Tjmax  
Rd=90mΩ  
Tt0=0.85V  
Epoxy printed circui t boar d FR4  
cop per thicknes s = 35µm  
Tj =max  
1.0  
0.1  
Tj = 25°C  
S(cm²)  
VTM(V)  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
0
2
4
6
8
10  
12  
14  
16  
18  
20  
Page 5 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
Case Style  
TO-220AB  
10.54 (0.415) MAX.  
4.70 (0.185)  
9.40 (0.370)  
9.14 (0.360)  
3.91 (0.154)  
3.74 (0.148)  
4.44 (0.1754)  
1.39 (0.055)  
1.14 (0.045)  
2.87 (0.113)  
2.62 (0.103)  
3.68 (0.145)  
3.43 (0.135)  
15.32 (0.603)  
14.55 (0.573)  
16.13 (0.635)  
15.87 (0.625)  
PIN  
8.89 (0.350)  
8.38 (0.330)  
1
2
3
4.06 (0.160)  
3.56 (0.140)  
29.16 (1.148)  
28.40 (1.118)  
2.79 (0.110)  
2.54 (0.100)  
1.45 (0.057)  
1.14 (0.045)  
14.22 (0.560)  
13.46 (0.530)  
2.67 (0.105)  
2.41 (0.095)  
0.90 (0.035)  
0.70 (0.028)  
5.20 (0.205)  
4.95 (0.195)  
2.65 (0.104)  
2.45 (0.096)  
0.56 (0.022)  
0.36 (0.014)  
TO-251  
(I-PAK)  
6.6(0.26)  
6.4(0.52)  
2.4(0.095)  
2.2(0.086)  
1.5(0.059)  
0.62(0.024)  
0.48(0.019)  
5.4(0.212)  
5.2(0.204)  
1.37(0.054)  
6.2(0.244)  
6(0.236)  
4T  
16.3(0.641)  
15.9(0.626)  
1.9(0.075)  
1.8(0.071)  
9.4(0.37)  
9(0.354)  
0.85(0.033)  
0.76(0.03)  
0.65(0.026)  
0.55(0.021)  
4.6(0.181)  
4.4(0.173)  
0.62(0.024)  
0.45(0.017)  
TO-252  
(D-PAK)  
2.4(0.095)  
2.2(0.086)  
6.6(0.259)  
6.4(0.251)  
1.5(0.059)  
5.4(0.212)  
5.2(0.204)  
0.62(0.024)  
0.48(0.019)  
1.37(0.054)  
2
6.2(0.244)  
6(0.236)  
9.35(0.368)  
10.1(0.397)  
1
2
3
0.89(0.035)  
0.62(0.024)  
0.45(0.017)  
0.64(0.025)  
1.14(0.045)  
0.76(0.030)  
2.28(0.090)  
2
4.57(0.180)  
(A2)  
(G)3  
1(A1)  
Page 6 of 7  
www.nellsemi.com  
RoHS  
RoHS  
4PT Series  
SEMICONDUCTOR  
Case Style  
TO-202-3  
10.1 Max.  
4.50  
1
2
3
1.4 Max.  
0.70  
1.50  
0.50  
Max.  
2.54 2.54  
TO-126  
7.5  
2.5  
3.8  
3.1  
10.8  
2.54  
15.9  
1
2
3
0.76  
0.5  
2.29  
4.58  
1.2  
2
(A2)  
(G)3  
1(A1)  
Page 7 of 7  
www.nellsemi.com  
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