IXXH50N60B3D1
Symbol Test Conditions
(TJ = 25°C Unless Otherwise Specified)
Characteristic Values
TO-247 (IXXH) Outline
Min.
Typ.
Max.
gfs
IC = 36A, VCE = 10V, Note 1
12
19
S
Cies
Coes
Cres
2230
195
44
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
Qg(on)
Qge
Qgc
70
16
29
nC
nC
nC
IC = 36A, VGE = 15V, VCE = 0.5 • VCES
td(on)
tri
Eon
td(off)
tfi
27
40
ns
ns
mJ
ns
ns
1 - Gate
2,4 - Collector
3 - Emitter
Inductive load, TJ = 25°C
IC = 36A, VGE = 15V
0.67
100
135
0.74
150
VCE = 360V, RG = 5
Note 2
Eof
1.20 mJ
f
td(on)
tri
30
45
ns
ns
Inductive load, TJ = 150°C
IC = 36A, VGE = 15V
Eon
td(off)
tfi
1.40
130
190
1.20
mJ
ns
VCE = 360V, RG = 5
ns
Note 2
Eoff
mJ
RthJC
RthCS
0.25 °C/W
°C/W
0.21
Reverse Diode (FRED)
Symbol Test Conditions
Characteristic Values
(TJ = 25°C Unless Otherwise Specified)
Min. Typ.
Max.
VF
IF = 30A, VGE = 0V, Note 1
2.7
V
V
TJ = 150°C
1.6
IRM
trr
TJ = 100°C
TJ = 100°C
4
A
ns
ns
IF = 30A, VGE = 0V, -diF/dt = 100A/μs,
VR = 100V
100
25
IF = 1A, VGE = 0V, -diF/dt = 100A/μs, VR = 30V
RthJC
0.9 °C/W
Notes:
1. Pulse test, t 300μs, duty cycle, d 2%.
2. Switching times & energy losses may increase for higher VCE(clamp), TJ or RG.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537