IXGH 30N60BU1
IXGT 30N60BU1
Symbol
gfs
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
TO-247 AD Outline
IC = IC110; VCE = 10 V,
25
S
Pulse test, t ≤ 300 µs, duty cycle ≤ 2 %
P
Cies
Coes
Cres
2710
240
50
pF
pF
pF
VCE = 25 V, VGE = 0 V, f = 1 MHz
Qg
110
22
150 nC
35 nC
75 nC
Qge
Qgc
IC = IC110, VGE = 15 V, VCE = 0.5 VCES
e
40
Dim.
A
Millimeter
Min. Max.
Inches
Min. Max.
Inductive load, TJ = 25°C
td(on)
tri
td(off)
tfi
25
30
ns
ns
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
IC = IC110, VGE = 15 V, L = 100 µH,
A
1
VCE = 0.8 VCES, RG = Roff = 4.7 Ω
A
2
130
100
1.0
220 ns
190 ns
2.0 mJ
b
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
Remarks: Switching times may
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
b
1
,
b
2
Eoff
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
20.80 21.46
15.75 16.26
5.20
19.81 20.32
4.50
3.65
6.40 0.232 0.252
td(on)
tri
25
35
ns
ns
mJ
ns
ns
Inductive load, TJ = 150°C
e
5.72 0.205 0.225
.780 .800
.177
.140 .144
IC = IC110, VGE = 15 V, L = 100 µH
VCE = 0.8 VCES, RG = Roff = 4.7 Ω
Remarks: Switching times may
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
L
Eon
td(off)
tfi
1
L1
P3.55
200
230
Q
5.89
4.32
R
S
5.49
.170 .216
242 BSC
,
6.15 BSC
Eoff
2.5
mJ
RthJC
RthCK
0.62 K/W
K/W
TO-247 AA (D3 PAK)
0.25
ReverseDiode(FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol
VF
TestConditions
min. typ. max.
IF = IC110, VGE = 0 V,
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
1.6
15
V
A
IRM
IF = IC110, VGE = 0 V, -diF/dt = 240 A/µs
VR = 360 V
IF = 1 A; -di/dt = 100 A/µs; VR = 30 V
10
35
trr
50 ns
1 K/W
RthJC
Dim.
Millimeter
Min. Max.
Inches
Min. Max.
A
4.9
2.7
.02
5.1
2.9
.25
.193 .201
.106 .114
.001 .010
Min Recommended Footprint
A1
A2
b
1.15
1.9
.4
1.45
2.1
.045 .057
b2
C
.75
.83
.65
.016 .026
D
E
13.80 14.00
15.85 16.05
13.3 13.6
5.45 BSC
18.70 19.10
.543 .551
.624 .632
.524 .535
E1
e
.215 BSC
.736 .752
.094 .106
H
L
2.40
1.20
2.70
1.40
L1
.047 .055
L2
L3
L4
1.00
1.15
.039 .045
.010 BSC
0.25 BSC
3.80 4.10
.150 .161
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETSandIGBTsarecoveredbyoneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,486,715 6,306,728B1
5,381,025