IXGQ 28N120B
IXGQ 28N120BD1
Symbol
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
TO-3P (IXTQ) Outline
gfs
IC = 28A; VCE = 10 V,
Note 2
20
30
S
Cies
2700
170
pF
pF
28N120B
Coes
Cres
VCE = 25 V, VGE = 0 V, f = 1 MHz
28N120BD1 180
60
pF
pF
Qg
92
17
37
nC
nC
nC
Qge
Qgc
IC = 28A, VGE = 15 V, VCE = 0.5 VCES
td(on)
tri
30
20
ns
ns
Inductive load, TJ = 25°C
IC = 28 A; VGE = 15 V
td(off)
180
280 ns
VCE = 0.8 VCES; RG = Roff = 5 Ω
tf i
Eoff
160
2.0
320 ns
5.0 mJ
Note 1.
td(on)
tri
35
28
ns
ns
Inductive load, TJ = 125°C
IC = 28A; VGE = 15 V
Eon
td(off)
2.5
250
mJ
ns
VCE = 0.8 VCES; RG = Roff = 5 Ω
Note 1
tf i
Eoff
300
8.0
ns
mJ
RthJC
RthCK
0.5 K/W
K/W
0.25
ReverseDiode(FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
IF
TestConditions
TC = 90°C
10
A
VF
IF = 10 A, VGE = 0 V
IF = 10 A, VGE = 0 V, TJ = 125°C
2.95
2.0
V
V
IRM
trr
IF = 10 A; -diF/dt = 400 A/µs, VR = 600 V
VGE = 0 V; TJ = 125°C
14
120
A
ns
trr
IF = 1 A; -diF/dt = 100 A/µs; VR = 30 V, VGE = 0 V
40
ns
RthJC
2.5 K/W
Notes: 1.
2.
Switching times may increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG.
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
,
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered byoneormore
ofthefollowingU.S.patents:
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6,404,065B1 6,162,665
6,306,728B1 6,259,123B1 6,306,728B1 6,683,344
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