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HYS64D128020GBDL-6-A

型号:

HYS64D128020GBDL-6-A

品牌:

INFINEON[ Infineon ]

页数:

11 页

PDF大小:

109 K

HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
2.5V 200Pin DDR-I SDRAM Small Outline Modules  
1GB Module  
PC1600, PC2100 & PC2700  
Preliminary Data Sheet V0.6, 2003-01-07  
200-pin Unbuffered 8-Byte Dual-In-Line  
DDR-I SDRAM non-parity Small Outline  
Modules  
Programmable CAS Latency, Burst Length,  
and Wrap Sequence (Sequential &  
Interleave)  
128M x 64 organization with two memory  
banks  
Auto Refresh (CBR) and Self Refresh  
All inputs and outputs SSTL_2 compatible  
Serial Presence Detect with E2PROM  
JEDEC standard Double Data Rate  
Synchronous DRAMs (DDR-I SDRAM)  
Jedec standard form factor:  
67.60mm P 31.75mm P 3.80mm  
Single +2.5V (M0.2V) power supply  
Uses eight 1Gbit DDR-I SDRAM components  
(2x 64Mb x8) made of stacked 512Mb dies in  
P-TFBGA package.  
Gold plated contacts  
Performance  
-6  
-7  
Unit  
Component Speed Grade  
DDR333  
PC2700  
166  
DDR266A  
PC2100  
143  
Module Speed Grade  
fCK Clock Frequency (max.) @ CL = 2.5  
fCK Clock Frequency (max.) @ CL = 2  
MHz  
MHz  
133  
133  
The HYS64D128020GBDL are industry standard 200-pin 8-byte Small Outline Dual in-line Memory  
Modules (DIMMs) organized as 128M x 64 in two memory banks. The memory array is designed  
with Double Data Rate Synchronous DRAMs. A variety of decoupling capacitors are mounted on  
the PC board. The DIMMs feature serial presence detect based on a serial E2PROM device using  
the 2-pin I2C protocol. The first 128 bytes are programmed with configuration data and the second  
128 bytes are available to the customer.  
INFINEON Technologies AG  
1
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Ordering Information  
Type  
Compliance Code  
Description  
SDRAM Technology  
HYS64D128020GBDL-6-A PC2700S-2533-0-Z  
HYS64D128020GBDL-7-A PC2100S-2033-0-Z  
1GB SO-DIMM  
w/ 2 banks  
512Mbit  
Stacked Die in a FBGA  
Note: All part numbers end with a place code, designating the silicon die revision. Reference  
information available on request. Example: HYS 64D128020GBDL-8-A, indicating Rev.A die is  
used for DDR-SDRAM components.  
The Compliance Code which is printed on the module labels describes the speed sort class  
(“e.g. PC2100”), the module type (“S”), the latencies (e.g. 2033 means CAS latency = 2.0, RCD  
latency = 3 and row precharge latency = 3), the JEDEC SPD Revision (“0”) and the Raw Card  
used on this DIMM (“Z”).  
Pin Definitions and Functions  
Pin Name  
A0 - A12  
Pin Function  
Pin Name  
CS0, CS1  
VDD  
Pin Function  
Address Inputs  
Chip Selects  
BA0, BA1  
DQ0 - DQ63  
RAS  
Bank Selects  
Power (+ 2.5 V)  
Data Input/Output  
Row Address Strobe  
Column Address Strobe  
Read/Write Input  
VSS  
Ground  
VDDQ  
I/O Driver power supply  
VDD Indentification flag  
I/O reference supply  
Serial EEPROM power supply  
Serial bus clock  
CAS  
VDDID  
WE  
VREF  
CKE0 - CKE1  
DQS0 - DQS8  
CLK0 - CLK1,  
CLK0 - CLK1  
DM0 - DM8  
DQS0 - DQS8  
Clock Enable  
VDDSPD  
SCL  
SDRAM low data strobes  
SDRAM clock (positive lines)  
SDRAM clock (negative lines)  
data masks  
SDA  
Serial bus data line  
slave address select  
no connect  
SA0 - SA2  
NC  
data strobes  
DU  
Dont use, reserved  
Address Format  
Density Organization Memory SDRAMs  
Banks  
# of  
SDRAMs  
SDRAM  
density  
# of row/ Refresh Period Interval  
bank/  
column bits  
1024 MB 128M P 64  
2
64M x 8  
16  
512 Mbit  
13/2/11  
8k  
64 ms 7.8 s  
INFINEON Technologies AG  
2
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Pin Configuration  
Pin  
#
Pin  
#
Pin  
#
Pin  
#
Pin  
#
Pin  
#
Pin  
#
Pin  
#
Front  
Side  
Back  
Side  
Front  
Side  
Back  
Side  
Front  
Side  
Back  
Side  
Front  
Side  
Back  
Side  
1
3
5
7
9
VREF  
VSS  
2
4
6
8
VREF  
VSS  
51  
VSS  
52 VSS  
101  
A9  
102 A8  
151 DQ42 152 DQ46  
153 DQ43 154 DQ47  
155 VDD 156 VDD  
53 DQ19 54 DQ23  
55 DQ24 56 DQ28  
103 VSS 104 VSS  
DQ0  
DQ1  
DQ4  
DQ5  
105  
A7  
106 A6  
57  
VDD  
58 VDD  
107  
109  
111  
A5  
A3  
A1  
108 A4  
110 A2  
112 A0  
157 VDD 158 CK1  
159 VSS 160 CK1  
161 VSS 162 VSS  
163 DQ48 164 DQ52  
165 DQ49 166 DQ53  
VDD 10 VDD  
59 DQ25 60 DQ29  
61 DQS3 62 DM3  
11 DQS0 12 DM0  
13 DQ2 14 DQ6  
15 VSS 16 VSS  
17 DQ3 18 DQ7  
19 DQ8 20 DQ12  
63  
VSS  
64 VSS  
113 VDD 114 VDD  
A10/AP  
65 DQ26 66 DQ30  
67 DQ27 68 DQ31  
115  
116 BA1  
117 BA0 118 RAS  
119 WE 120 CAS  
121 CS0 122 CS1  
167 VDD 168 VDD  
169 DQS6 170 DM6  
69  
VDD  
70 VDD  
21 VDD 22 VDD  
23 DQ9 24 DQ13  
25 DQS1 26 DM1  
27 VSS 28 VSS  
29 DQ10 30 DQ14  
31 DQ11 32 DQ15  
33 VDD 34 VDD  
35 CK0 36 VDD  
71 (CB0) 72 (CB4)  
73 (CB1) 74 (CB5)  
171 DQ50 172 DQ54  
173 VSS 174 VSS  
175 DQ51 176 DQ55  
177 DQ56 178 DQ60  
179 VDD 180 VDD  
181 DQ57 182 DQ61  
183 DQS7 184 DM7  
185 VSS 186 VSS  
123  
DU  
124 DU  
75  
VSS  
76 VSS  
125 VSS 126 VSS  
127 DQ32 128 DQ36  
129 DQ33 130 DQ37  
131 VDD 132 VDD  
133 DQS4 134 DM4  
135 DQ34 136 DQ38  
77 (DQS8) 78 (DM8)  
79 (CB2) 80 (CB6)  
81  
VDD  
82 VDD  
83 (CB3) 84 (CB7)  
85  
87  
DU  
86  
DU  
37 CK0 38 VSS  
39 VSS 40 VSS  
VSS  
88 VSS  
137 VSS 138 VSS  
139 DQ35 130 DQ39  
187 DQ58 188 DQ62  
189 DQ59 190 DQ63  
89 (CK2) 90 VSS  
91 (CK2) 92 VDD  
41 DQ16 42 DQ20  
43 DQ17 44 DQ21  
45 VDD 46 VDD  
47 DQS2 48 DM2  
49 DQ18 50 DQ22  
141 DQ40 142 DQ44  
143 VDD 144 VDD  
145 DQ41 146 DQ45  
147 DQS5 148 DM5  
149 VSS 150 VSS  
191 VDD 192 VDD  
193 SDA 194 SA0  
195 SCL 196 SA1  
93  
VDD  
94 VDD  
95 CKE1 96 CKE0  
Vddspd  
198 SA2  
97  
99  
DU  
98  
DU  
197  
A12  
100 A11  
199 Vddid 200 DU  
Note: Pins 71, 72, 73, 74, 77, 78, 79, 80, 83, 84, 89 and 91 are reserved for x72 variants of this module and are not used on the  
x64 versions. Pin 86 is reserved for a registered variant of this module and is not used on the unbuffered version  
front side  
back side  
INFINEON Technologies  
3
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
CS0  
CS1  
CS0  
CS1  
D0  
CS0  
CS1  
D4  
DQS0  
DM0  
DQS  
DM  
DQS4  
DM4  
DQS  
DM  
DQ[7:0]  
DQ[7:0]  
DQ[39:32]  
DQ[7:0]  
8x  
8x  
8x  
8x  
CS0  
CS1  
D1  
CS0  
CS1  
D5  
DQS1  
DM1  
DQ[15:8]  
DQS  
DQS5  
DM5  
DQ[47:40]  
DQS  
DM  
DQ[7:0]  
DM  
DQ[7:0]  
CS0  
CS1  
D2  
CS0  
CS1  
D6  
DQS2  
DM2  
DQS  
DM  
DQS6  
DM6  
DQS  
DM  
DQ[23:16]  
DQ[7:0]  
DQ[55:48]  
DQ[7:0]  
8x  
8x  
8x  
8x  
CS0  
CS1  
D3  
CS0  
CS1  
D7  
DQS3  
DM3  
DQ[31:24]  
DQS  
DQS7  
DM7  
DQ[63:56]  
DQS  
DM  
DQ[7:0]  
DM  
DQ[7:0]  
Serial SPD (256wordx8bit)  
A0-A12, BA0, BA1  
RAS, CAS, WE  
D0 - D7  
D0 - D7  
A0  
A1  
A2  
SA0  
SA1  
SA2  
CKE0  
D0 - D7  
CKE1  
D0 - D7  
SCL  
SDA  
WP  
SCL  
SDA  
SPD  
D0 - D7  
D0 - D7  
VDDSPD  
VREF  
VDD  
8 Loads  
8 Loads  
CLK0 / CLK0  
CLK1 / CLK1  
VSS  
VDDID  
D0 - D7, SPD  
D0 - D7, SPD  
open  
Note  
1. DQ wiring may differ than describes in this drawing, however DQ/DM/DQS relationship  
must be maintained as shown.  
2. All resistors are 22 Ohm.  
Block Diagram: Two Banks 128M x 64 DDR-SDRAM SO-DIMM Modules  
using x8 Organized SDRAMs  
INFINEON Technologies AG  
4
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Absolute Maximum Ratings  
Parameter  
Symbol  
Limit Values  
Unit  
min.  
max.  
3.6  
3.6  
+150  
1
Input / Output voltage relative to VSS  
Power supply voltage on VDD/VDDQ to VSS  
Storage temperature range  
VIN, VOUT  
VDD, VDDQ  
TSTG  
-0.5  
-0.5  
-55  
V
V
oC  
W
mA  
Power dissipation (per SDRAM component)  
Data out current (short circuit)  
PD  
IOS  
50  
Permanent device damage may occur if “Absolute Maximum Ratings” are exceeded.  
Functional operation should be restricted to recommended operation conditions.  
Exposure to higher than recommended voltage for extended periods of time affect device reliability  
Supply Voltage Levels  
Parameter  
Symbol  
Limit Values  
nom.  
Unit  
Notes  
min.  
2.3  
max.  
2.7  
Device Supply Voltage  
Output Supply Voltage  
Input Reference Voltage  
Termination Voltage  
VDD  
2.5  
V
V
V
V
V
VDDQ  
VREF  
VTT  
2.3  
2.5  
2.7  
1
2
3
0.49 x VDDQ  
VREF - 0.04  
2.3  
0.5 x VDDQ  
VREF  
0.51 x VDDQ  
VREF + 0.04  
3.6  
EEPROM supply voltage  
VDDSPD  
2.5  
1
2
Under all conditions, VDDQ must be less than or equal to VDD  
Peak to peak AC noise on VREF may not exceed ± 2% VREF (DC)  
VREF is also expected to track noise variations in VDDQ  
VTT of the transmitting device must track VREF of the receiving device.  
.
.
3
DC Operating Conditions (SSTL_2 Inputs)  
(VDDQ = 2.5 V, TA = 70 LC, Voltage Referenced to VSS)  
Parameter  
Symbol  
Limit Values  
Unit  
Notes  
min.  
max.  
DC Input Logic High  
DC Input Logic Low  
Input Leakage Current  
Output Leakage Current  
VIH (DC)  
VIL (DC)  
IIL  
VREF + 0.15  
VDDQ + 0.3  
V
V
1
-0.30  
-5  
VREF - 0.15  
5
5
A  
A  
1
2
IOL  
-5  
1) The relationship between the VDDQ of the driving device and the VREF of the receiving device is what  
determines noise margins. However, in the case of VIH (max) (input overdrive), it is the VDDQ of the receiving  
device that is referenced. In the case where a device is implemented such that it supports SSTL_2 inputs but  
has no SSTL_2 outputs (such as a translator), and therefore no VDDQ supply voltage connection, inputs must  
tolerate input overdrive to 3.0 V (High corner VDDQ + 300 mV).  
2) For any pin under test input of 0 V ? VIN ? VDDQ + 0.3 V. Values are shown per DDR-SDRAM component.  
INFINEON Technologies  
5
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Operating, Standby and Refresh Currents  
1GB, 2 banks  
-6  
PC2700S-2533 PC2100S-2033  
1GB, 2 banks  
-7  
Notes  
Symbol Parameter/Condition  
Unit  
4
1
TYP  
MAX  
TYP  
MAX  
Operating Current: one bank; active / precharge; tRC = tRC MIN;  
DQ, DM, and DQS inputs changing once per clock cycle; address and control inputs  
changing once every two clock cycles  
IDD0  
1360  
1560  
1208  
1400  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Operating Current: one bank; active/read/precharge; burst length 4;  
Refer to the following page for detailed test conditions.  
IDD1  
1552  
120  
1760  
176  
1416  
112  
1600  
160  
1, 3  
2
Precharge Power-Down Standby Current: all banks idle; power-down mode;  
CKE <= VIL MAX  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
Precharge Floating Standby Current: /CS >= VIH MIN, all banks idle;  
CKE >= VIH MIN; address and other control inputs changing once per clock cycle, VIN =  
VREF for DQ, DQS and DM.  
576  
656  
496  
560  
2
Precharge Quiet Standby Current: /CS >= VIH MIN, all banks idle;  
CKE >= VIH MIN; address and other control inputs stable  
at >= VIH MIN or <= VIL MAX; VIN = VREF for DQ, DQS and DM.  
440  
528  
384  
448  
2
Active Power-Down Standby Current: one bank active; power-down mode;  
CKE <= VIL MAX; VIN = VREF for DQ, DQS and DM.  
256  
320  
224  
288  
2
Active Standby Current: one bank active; CS >= VIH MIN; CKE >= VIH MIN;  
IDD3N tRC = tRAS MAX; DQ, DM, and DQS inputs changing twice per clock cycle; address and  
control inputs changing once per clock cycle  
688  
800  
608  
720  
2
Operating Current: one bank active; burst length 2; reads; continuous burst; address and  
IDD4R control inputs changing once per clock cycle; 50% of data outputs changing on every clock  
edge; CL = 2 for DDR200 and DDR266(A), CL=3 for DDR333 and DDR400; IOUT = 0mA  
1680  
1600  
2328  
40  
1960  
1880  
2600  
56  
1424  
1368  
2200  
40  
1680  
1600  
2480  
56  
1, 3  
1
Operating Current: one bank active; Burst = 2; writes; continuous burst; address and  
IDD4W control inputs changing once per clock cycle; 50% of data outputs changing on every clock  
edge; CL = 2 for DDR200 and DDR266(A), CL=3 for DDR333 and DDR400  
Auto-Refresh Current: tRC = tRFC MIN, distributed refresh  
Self-Refresh Current: CKE <= 0.2V; external clock on  
IDD5  
IDD6  
IDD7  
1
Operating Current: four bank; four bank interleaving with burst length 4;  
Refer to the following page for detailed test conditions.  
3056  
3440  
2536  
3000  
1, 3  
1. The module IDD values are calculated from the component IDD datasheet values as: IDDx[component] * m + IDD3N[component] * n  
with m, n number of components of bank 1 and 2; n=0 for 1 bank modules  
2. The module IDD values are calculated from the component IDD datasheet values as: IDDx[component] * (m + n)  
3. DQ I/O (IDDQ) currents are not included into calculations: module IDD values will be measured differently depending on load conditions  
4. Test condition for typical values : VDD = 2.5V ,Ta = 25°C, test condition for maximum values: test limit at VDD = 2.7V ,Ta = 10°C  
INFINEON Technologies AG  
6
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Electrical Characteristics & AC Timing for DDR-I components  
(for reference only)  
(0 LC ?ꢁTA ?ꢁ70ꢁLCꢂꢁVDDQ = 2.5V Mꢁ0.2V; VDD = 2.5V Mꢁ0.2V)  
DDR333  
-6  
DDR266A  
-7  
Symbol  
Parameter  
Unit  
Notes  
1-4  
min.  
max.  
min.  
max.  
tAC  
+ 0.7  
0.75  
0.75  
ns  
DQ output access time from CK/CK  
- 0.7  
tDQSCK  
tCH  
+ 0.6  
0.55  
0.55  
0.75  
0.45  
0.75  
0.55  
ns  
tCK  
tCK  
ns  
ns  
ns  
ns  
ns  
ns  
1-4  
1-4  
1-4  
1-4  
1-4  
1-4  
1-4  
1-4  
1, 10  
DQS output access time from CK/CK  
CK high-level width  
- 0.6  
0.45  
0.45  
tCL  
CK low-level width  
0.45  
0.55  
tHP  
Clock Half Period  
min (tCL, tCH  
)
min (tCL, tCH  
)
tCK  
CL = 2.5  
CL = 2.0  
6
12  
12  
7
12  
12  
Clock cycle time  
tCK  
7.5  
7.5  
0.5  
0.5  
2.2  
tDH  
DQ and DM input hold time  
DQ and DM input setup time  
0.45  
0.45  
2.2  
tDS  
tIPW  
Control and Addr. input pulse width (each input)  
1-4,  
11  
tDIPW  
tHZ  
DQ and DM input pulse width (each input)  
1.75  
- 0.7  
1.75  
ns  
ns  
Data-out high-impedence time from CK/CK  
+ 0.7  
0.75  
0.75  
1-4, 5  
tLZ  
Data-out low-impedence time from CK/CK  
Write command to 1st DQS latching transition  
- 0.7  
0.75  
+ 0.7  
1.25  
0.75  
0.75  
ns  
1-4, 5  
1-4  
tDQSS  
0.75  
1.25  
tCK  
DQS-DQ skew  
(for DQS & associated DQ signals)  
tDQSQ  
0.40  
0.5  
ns  
1-4  
tQHS  
tQH  
Data hold skew factor  
+ 0.50  
+ 0.75  
ns  
ns  
tCK  
tCK  
tCK  
tCK  
ns  
tCK  
tCK  
ns  
ns  
ns  
ns  
tCK  
tCK  
ns  
ns  
1-4  
1-4  
Data Output hold time from DQS  
tHP-tQHS  
0.35  
0.2  
tHP-tQHS  
0.35  
0.2  
0.2  
2
tDQSL,H DQS input low (high) pulse width (write cycle)  
1-4  
tDSS  
tDSH  
tMRD  
DQS falling edge to CK setup time (write cycle)  
DQS falling edge hold time from CK (write cycle)  
Mode register set command cycle time  
1-4  
0.2  
1-4  
2
1-4  
tWPRES Write preamble setup time  
0
0
1-4, 7  
1-4, 6  
1-4  
tWPST  
tWPRE  
Write postamble  
Write preamble  
0.40  
0.25  
0.75  
0.8  
0.60  
0.40  
0.25  
0.9  
1.0  
0.9  
1.0  
0.9  
0.40  
45  
0.60  
fast slew rate  
slow slew rate  
fast slew rate  
slow slew rate  
Address and control input setup  
time  
tIS  
2-4,  
10,11  
0.75  
0.8  
tIH  
Address and control input hold time  
tRPRE  
tRPST  
tRAS  
tRC  
Read preamble  
0.9  
1.1  
0.60  
1.1  
0.60  
1-4  
1-4  
1-4  
1-4  
Read postamble  
0.40  
42  
120,000  
Active to Precharge command  
70,000  
Active to Active/Auto-refresh command period  
60  
65  
Auto-refresh to Active/Auto-refresh  
command period  
tRFC  
72  
75  
ns  
1-4  
tRCD  
tRP  
tRRD  
tWR  
Active to Read or Write delay  
Precharge command period  
Active bank A to Active bank B command  
Write recovery time  
18  
18  
12  
15  
20  
20  
15  
15  
ns  
ns  
ns  
ns  
1-4  
1-4  
1-4  
1-4  
Auto precharge write recovery  
+ precharge time  
tDAL  
(twr/tck) + (trp/tck)  
tCK  
1-4,9  
INFINEON Technologies  
7
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
DDR333  
-6  
DDR266A  
-7  
Symbol  
Parameter  
Unit  
Notes  
min.  
max.  
min.  
max.  
tWTR  
tXSNR  
tXSRD  
tREFI  
Internal write to read command delay  
Exit self-refresh to non-read command  
Exit self-refresh to read command  
Average Periodic Refresh Interval  
1
1
tCK  
ns  
tCK  
s  
1-4  
1-4  
75  
75  
200  
200  
1-4  
7.8  
7.8  
1-4, 8  
1. Input slew rate >=1V/ns for DDR266 & DDR333 and = 1V/ns for DDR200.  
2. The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference  
level for signals other than CK/CK, is VREF. CK/CK slew rate are >= 1.0 V/ns.  
3. Inputs are not recognized as valid until VREF stabilizes.  
4. The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (Note 3) is VTT  
.
5. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred  
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).  
6. The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but  
system performance (bus turnaround) degrades accordingly.  
7. The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge.  
A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were  
previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress,  
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS  
.
8. A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.  
9. For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock  
cycle time.  
10. These parameters guarantee device timing, but they are not necessarily tested on each device  
11. Fast slew rate >= 1.0 V/ns , slow slew rate >= 0.5 V/ns and < 1V/ns for command/address and CK & CK slew rate >1.0 V/  
ns, measured between VOH(ac) and VOL(ac)  
INFINEON Technologies AG  
8
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
SPD Codes  
Byte# Description  
SPD Entry Value  
PC2100  
PC2700  
Number of SPD Bytes  
128  
0
80  
08  
07  
0D  
0B  
02  
40  
00  
04  
Total Bytes in Serial PD  
Memory Type  
256  
1
DDR-SDRAM  
2
Number of Row Addresses  
Number of Column Addresses  
Number of DIMM Banks  
Module Data Width  
13  
3
11  
4
2
5
x64  
6
Module Data Width (cont’d)  
Module Interface Levels  
SDRAM Cycle Time at CL = 2.5  
SDRAM Access Time from Clock at CL = 2.5  
DIMM Config  
0
7
SSTL_2.5  
7ns, 6ns  
0.75ns, 0.6ns  
non-ECC  
Self-Refresh 7.8s  
x8  
8
9
70  
75  
60  
70  
10  
11  
12  
13  
14  
15  
00  
82  
08  
00  
01  
Refresh Rate/Type  
SDRAM Width, Primary  
Error Checking SDRAM Data Width  
na  
Minimum Clock Delay for Back-to-Back Random  
Column Address  
tCCD = 1 CLK  
Burst Length Supported  
Number of SDRAM Banks  
Supported CAS Latencies  
CS Latencies  
2, 4 & 8  
16  
17  
18  
19  
20  
21  
22  
0E  
04  
0C  
01  
02  
20  
C1  
4
CAS latency = 2 & 2.5  
CS latency = 0  
Write latency = 1  
unbuffered  
WE Latencies  
SDRAM DIMM Module Attributes  
SDRAM Device Attributes: General  
Conc. AP  
weak driver  
Min. Clock Cycle Time at CAS Latency = 2  
Max. Data Access Time from Clock for CL = 2  
Minimum Clock Cycle Time at CL = 1.5  
7.5ns  
23  
75  
75  
75  
70  
0.75ns, 0.7ns  
not supported  
24  
25  
00  
00  
Maximum Data Access Time from Clock at CL = 1.5 not supported  
26  
Minimum Row Precharge Time  
Minimum Row Active to Row Active Delay tRRD  
Minimum RAS to CAS Delay tRCD  
Minimum RAS Pulse Width tRAS  
Module Bank Density (per bank)  
Addr. and Command Setup Time  
Addr. and Command Hold Time  
Data Input Setup Time  
20ns, 18ns  
15ns, 12ns  
20ns, 18ns  
45ns, 42ns  
512 MByte  
0.9 ns, 0.75ns  
0.9 ns, 0.75ns  
0.5ns, 0.45 ns  
0.5ns, 0.45 ns  
27  
50  
3C  
50  
2D  
48  
30  
48  
2A  
28  
29  
30  
31  
80  
32  
90  
90  
50  
50  
75  
75  
45  
45  
33  
34  
Data Input Hold Time  
35  
Superset Information  
36-40  
41  
00  
30  
Minimum Core Cycle Time tRC  
Min. Auto Refresh Cmd Cycle Time tRFC  
Maximum Clock Cycle Time tck  
Max. DQS-DQ Skew tDQSQ  
X-Factor tQHS  
65 ns, 60 ns  
75ns, 72 ns  
12 ns  
41  
3C  
48  
42  
4B  
43  
0.5 ns, 0.4 ns  
0.75ns, 0.5 ns  
44  
32  
75  
28  
50  
45  
Superset Information (may be used in future)  
SPD Revision  
46-61  
62  
00  
00  
Revision 0.0  
INFINEON Technologies  
9
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Byte# Description  
SPD Entry Value  
PC2100  
PC2700  
Checksum for Bytes 0 - 62  
63  
F5  
39  
Manufacturers JEDEC ID  
Manufacturer  
64  
C1  
INFINEO(N)  
65-71  
72  
Assembly Manufacturing Location  
Module Part Number  
73-90  
91-92  
93-94  
95-98  
99-127  
128-255  
Module Revision Code  
Module Manufacturing Date  
Module Serial Number  
Superset Information  
Open for Customer Use  
INFINEON Technologies AG  
10  
V0.6, 2003-01-07  
HYS64D128020GBDL-[6/7]-A  
DDR-SDRAM SO-DIMM Modules  
Package Outlines  
DDR-SDRAM SO-DIMM Modules  
67.6 ±  
63.6  
0.15  
3.8 max.  
0.  
1
39  
11.4  
1
41  
199  
±
1
2.15  
2.45  
2.15  
47.4  
11.55  
4.2  
1.0  
40 42  
2.45  
2
200  
1.8  
4
Detail of Contacts  
Detail of Chamfer  
0.2  
0.15  
-
0.45  
0.6  
L-DIM-200-20  
INFINEON Technologies AG  
11  
V0.6, 2003-01-07  
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