IXGF25N250
ISOPLUS i4-PakTM (HV) (IXGF) Outline
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = 50A, VCE = 10V, Note 1
VGE = 15V, VCE = 20V, Note 1
16
26
S
A
IC(ON)
240
Cies
Coes
Cres
2970
98
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
36
Qg
75
15
30
nC
nC
nC
Qge
Qgc
IC = 50A, VGE = 15V, VCE = 0.5 • VCES
td(on)
tr
td(off)
tf
68
233
209
200
ns
ns
ns
ns
Resistive Switching Times
IC = 50A, VGE = 15V
VCE = 1250V, RG = 5Ω
RthJC
RthCS
RthJA
1.10 °C/W
°C/W
0.15
30
°C/W
Notes: 1. Pulse Test, t < 300µs; Duty Cycle, d < 2%.
2. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537