IXGH28N140B3H1 IXGK28N140B3H1
IXGX28N140B3H1
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = IC110, VCE = 10V, Note 1
VCE = 25V, VGE = 0V, f = 1 MHz
12
19
S
Cies
Coes
Cres
Qg(on)
Qge
Qgc
td(on)
tri
1830
163
46
pF
pF
pF
nC
nC
nC
ns
88
IC = IC110, VGE = 15V, VCE = 0.5 • VCES
12
38
16
Inductive load, TJ = 25°C
IC = IC110, VGE = 15V
VCE = 960V, RG = 5Ω
Note 3
36
ns
Eon
td(off)
tfi
3.6
190
360
3.9
16
mJ
400 ns
ns
Eoff
td(on)
tri
6.5
J
ns
Inductive load, TJ = 125°C
50
ns
IC = IC110, VGE = 15V
Eon
td(off)
tfi
7.3
215
700
6.5
mJ
ns
VCE = 960V, RG = 5Ω
ns
Note 3
Eoff
RthJC
RthCs
mJ
0.42 °C/W
°C/W
0.21
0.15
°C/W
Reverse Diode (FRED)
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
VF
trr
IF = 20A, VGE = 0V, Note 1
3.0
V
V
TJ = 150°C
2.65
350
ns
IF = 20A, VGE = 0V, -diF/dt = -200A/μs,
VR = 1200V, TJ = 125°C
IRM
18.5
A
RthJC
0.90 °C/W
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Part must be heatsunk for high-temp Ices measurement.
3. Switching times & energy losses may increase for higher VCE(Clamp), TJ or RG.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537