IXGH30N120B3D1
IXGT30N120B3D1
Symbol
Test Conditions
Characteristic Values
TO-247 AD Outline
(TJ = 25°C, unless otherwise specified)
Min.
Typ.
Max.
gfs
IC = 30A, VCE = 10V, Note 1
VCE = 25V, VGE = 0V, f = 1MHz
11
19
S
Cies
Coes
Cres
1750
120
46
pF
pF
pF
∅ P
Qg
87
15
39
nC
nC
nC
Qge
Qgc
IC = 30A, VGE = 15V, VCE = 0.5 • VCES
e
Dim.
Millimeter
Min. Max.
Inches
Min. Max.
td(on)
tri
16
37
ns
ns
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
Inductive load, TJ = 25°C
IC = 30A, VGE = 15V, Notes 2
Eon
td(off)
tfi
3.47
127
204
2.16
mJ
200 ns
380 ns
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
VCE = 0.8 • VCES, RG = 5Ω
Eoff
4.0 mJ
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
20.80 21.46
15.75 16.26
td(on)
tri
18
38
ns
ns
e
L
L1
5.20
5.72 0.205 0.225
19.81 20.32
4.50
.780 .800
.177
Inductive load, TJ = 125°C
IC = 30A,VGE = 15V, Notes 2
Eon
td(off)
tfi
6.70
216
255
5.10
mJ
ns
∅P 3.55
Q
3.65
.140 .144
5.89
6.40 0.232 0.252
V
CE = 0.8 • VCES,RG = 5Ω
ns
R
4.32
5.49 .170 .216
Eoff
mJ
RthJC
RthCS
0.42 °C/W
°C/W
TO-268 Outline
0.21
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol
VF
Test Conditions
IF = 30A,VGE = 0V, Note 1
Min.
Typ. Max.
2.8
1.6
V
V
TJ = 150°C
IRM
4
A
IF = 30A,VGE = 0V, -diF/dt = 100A/μs, TJ = 100°C
VR = 300V TJ = 100°C
trr
100
ns
RthJC
0.9 °C/W
Note 1: Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Switching times may increase for VCE (Clamp) > 0.8 VCES
,
higher TJ or increased RG.
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered
by one or moreof the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,727,585
7,005,734 B2 7,157,338B2
7,063,975 B2
6,534,343
6,583,505
6,710,405 B2 6,759,692
6,710,463
6,771,478 B2 7,071,537