IXGH30N60C3D1
IXGT30N60C3D1
Symbol
Test Conditions
Characteristic Values
TO-268 (IXGT) Outline
(TJ = 25°C, unless otherwise specified)
Min.
Typ. Max.
gfs
IC = 20A, VCE = 10V, Note 1
9
30
S
Cies
Coes
Cres
915
78
32
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
Qg
Qge
Qgc
38
8
17
nC
nC
nC
IC = 20A, VGE = 15V, VCE = 0.5 • VCES
td(on)
tri
Eon
td(off)
tfi
16
26
ns
ns
Inductive load, TJ = 25°C
0.27
mJ
ns
IC = 20A, VGE = 15V
42
47
75
VCE = 300V, RG = 5Ω
ns
Eoff
0.09
0.18
mJ
td(on)
tri
Eon
td(off)
tfi
17
28
ns
ns
Inductive load, TJ = 125°C
0.44
70
mJ
ns
IC = 20A, VGE = 15V
V
CE = 300V, RG = 5Ω
90
ns
Eoff
0.33
mJ
RthJC
RthCS
0.56 °C/W
°C/W
(TO-247)
0.21
TO-247 AD Outline
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min. Typ. Max.
Symbol
VF
Test Conditions
IF = 30A, VGE = 0V, Note 1
∅ P
2.7
V
TJ = 150°C
1.6
V
IRM
trr
IF = 30A, VGE = 0V, -diF/dt = 100A/μs, TJ = 100°C
4
A
ns
ns
VR = 100V
TJ =100°C
100
25
IF = 1A, -di/dt = 100A/μs, VR = 30V
e
RthJC
0.9 °C/W
Dim.
Millimeter
Inches
Min. Max.
Min. Max.
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
Note 1: Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
20.80 21.46
15.75 16.26
e
5.20
5.72 0.205 0.225
L
L1
19.81 20.32
4.50
.780 .800
.177
∅P 3.55
3.65
.140 .144
Q
5.89
6.40 0.232 0.252
R
4.32
5.49 .170 .216
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered
by one or moreof the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,727,585
7,005,734 B2 7,157,338B2
7,063,975 B2
6,534,343
6,583,505
6,710,405 B2 6,759,692
6,710,463
6,771,478 B2 7,071,537