IXGA16N60B2D1 IXGP16N60B2D1
IXGH16N60B2D1
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = 12A, VCE = 10V, Note 1
VCE = 25V, VGE = 0V, f = 1MHz
8
S
Cies
Coes
Cres
675
70
pF
pF
pF
20
Qg(on)
Qge
24
5
nC
nC
nC
IC = 12A, VGE = 15V, VCE = 0.5 • VCES
Qgc
13
td(on)
tri
Eon
td(off)
18
ns
Inductive load, TJ = 25°C
IC = 12A, VGE = 15V
20
0.16
73
ns
mJ
ns
VCE = 400V, RG = 22Ω
tfi
70
ns
Note 2
Eoff
0.12
0.22 mJ
td(on)
tri
Eon
17
ns
Inductive load, TJ = 125°C
IC = 12A, VGE = 15V
20
0.26
ns
mJ
td(off)
tfi
Eoff
140
125
ns
ns
VCE = 400V, RG = 22Ω
Note 2
0.38
mJ
RthJC
RthCK
0.83 °C/W
TO-220
TO-247
0.50
0.21
°C/W
°C/W
Reverse Diode (FRED)
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
VF
IF = 10A, VGE = 0V, Note 1
3.0
V
V
TJ = 125°C
1.7
2.5
IRM
A
IF = 12A, VGE = 0V,
-diF/dt = 100A/μs, VR = 100V, TJ = 125°C
IF = 1A, VGE = 0V, -diF/dt = 100A/μs, VR = 30V
trr
trr
110
30
ns
ns
RthJC
2.5 °C/W
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Switching times & energy losses may increase for higher VCE(Clamp), TJ or RG.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537